Effect of the spectral width on mode partition noise in multimode VCSELs
暂无分享,去创建一个
The dependence of the mode partition noise (MPN) and the power penalty associated with it can be measured from the source spectral width. Our findings show that there is strong dependence of the carrier lifetime on the bit error rate degradation caused by MPN on the spectral width of the vertical cavity surface emitting laser (VCSEL). VCSELs with smaller spectral width (shorter carrier lifetime) exhibited smaller MPN induced power penalty. We found that the theoretical calculation of the power penalties caused by MPN from the carrier lifetime and the spectral width is in good agreement with the measured system penalties.
[1] C. Henry. Theory of the linewidth of semiconductor lasers , 1982 .
[2] The dependence of carrier lifetime on spectral width in multimode semiconductor lasers , 1996, IEEE Photonics Technology Letters.
[3] Ann-Kuo Chu,et al. The dependence of carrier lifetime on spectral width in multimode semiconductor lasers , 1996 .
[4] K. Ogawa,et al. Analysis of mode partition noise in laser transmission systems , 1982, IEEE Journal of Quantum Electronics.