Phenomenological analysis of domain width in rhombohedral BiFeO3 films

C. W. Huang,1 Lang Chen,1,* J. Wang,1 Q. He,2 S. Y. Yang,2 Y. H. Chu,3 and R. Ramesh2 1School of Materials Science and Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore 2Department of Physics, University of California–Berkeley, Berkeley, California 94720, USA 3Department of Materials Science and Engineering, National Chiao Tung University, Hsinchu, Taiwan 30013, Republic of China Received 10 August 2009; published 21 October 2009