Multifrequency Analysis of Faults in Analog Circuits
暂无分享,去创建一个
[1] B. Kaminska,et al. An integrated approach for analog circuit testing with a minimum number of detected parameters , 1994, Proceedings., International Test Conference.
[2] Bozena Kaminska,et al. Analog circuit fault diagnosis based on sensitivity computation and functional testing , 1992, IEEE Design & Test of Computers.
[3] Abhijit Chatterjee,et al. Fault-based automatic test generator for linear analog circuits , 1993, Proceedings of 1993 International Conference on Computer Aided Design (ICCAD).
[4] Marcantonio Catelani,et al. Analog network testability measurement: a symbolic formulation approach , 1991 .
[5] Bozena Kaminska,et al. Multifrequency testability analysis for analog circuits , 1994, Proceedings of IEEE VLSI Test Symposium.
[6] Mani Soma. A design-for-test methodology for active analog filters , 1990, Proceedings. International Test Conference 1990.
[7] Sheng-Jen Tsai,et al. Test Vector Generation for Linear Analog Devices , 1991, 1991, Proceedings. International Test Conference.
[8] Mani Soma. Probabilistic measures of fault equivalence in mixed-signal systems , 1991, Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's.
[9] Linda S. Milor,et al. Detection of catastrophic faults in analog integrated circuits , 1989, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[10] Ramaswami Dandapani,et al. Hard faults diagnosis in analog circuits using sensitivity analysis , 1993, Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium.
[11] Hans G. Kerkhoff,et al. Testability analysis of analog systems , 1990, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..