论文信息 - Hot-Carrier-Induced Forward and Reverse Saturation Current Degradations for the n-Type Symmetric EDMOS Transistor - 字舞流文

Hot-Carrier-Induced Forward and Reverse Saturation Current Degradations for the n-Type Symmetric EDMOS Transistor

Weifeng Sun | Siyang Liu | Wei Su | Yuwei Liu | Chunwei Zhang | A. Zhang | Tingting Huang | Chaohui Yu | X. He | Xingwen Wu