Variability Analysis of TiN Metal-Gate FinFETs
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Hiromi Yamauchi | Kunihiro Sakamoto | Takashi Matsukawa | Meishoku Masahara | Kazuhiko Endo | Shin-ichi O'uchi | Yuki Ishikawa | K. Endo | T. Matsukawa | S. O'Uchi | M. Masahara | Yongxun Liu | H. Yamauchi | Y. Ishikawa | J. Tsukada | K. Sakamoto | Yongxun Liu | Junichi Tsukada
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