An efficient design of embedded memories and their testability analysis using Markov chains

This article presents a design strategy for efficient and comprehensive random testing of embedded random-access memory (RAM) where neither are the address, read/write and data input lines directly controllable nor are the data output lines externally observable. Unlike the conventional approaches, which frequently employ on-chip circuits such as linear feedback shift register (LFSR), data registers and multibit comparator for verifying the response of the memory-under-test (MUT) with the reference signature of a fault-free gold unit, the proposed technique uses an efficient testable design, which helps accelerate test algorithms by a factor of 0.5√n, if the RAM is organized into an n×1 array and improve the test reliability by eliminating the LFSR that is known to have aliasing problems. Another serious problem in embedded memory testing by random test patterns is the problem of memory initialization, which has been tackled here by adding word-line flag registers. The paper has made indepth empirical studies of the functional faults such as stuck-at, coupling, and pattern-sensitive by suitably representing these faults by Markov chains and by simulating these chains to derive various test lengths required for detecting these faults. The simulation results conclusively show that, in order to test a IM-bit RAM for detecting the common functional faults, the proposed technique needs only one second as opposed to about an hour needed by the conventional random testing where memory cells are tested sequentially.