Development of a high lateral resolution TOF-SIMS apparatus for single particle analysis
暂无分享,去创建一个
[1] H. Arlinghaus,et al. Characterization of individual atmospheric aerosol particles with SIMS and laser-SNMS , 2006 .
[2] F. Kollmer. Cluster primary ion bombardment of organic materials , 2004 .
[3] M. Owari,et al. Analysis of surface composition and internal structure of fly ash particles using an ion and electron multibeam microanalyzer , 2003 .
[4] Birgit Hagenhoff,et al. High Resolution Surface Analysis by TOF-SIMS , 2000, Microchimica Acta.
[5] S. Bennison,et al. Grain boundary chemistry of alumina by high-resolution imaging SIMS , 1999 .
[6] R. Gijbels,et al. Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) , 1999 .
[7] A. Benninghoven,et al. Secondary ion emission from polymer surfaces under Ar+, Xe+ and SF5+ ion bombardment , 1998 .
[8] K. K. Soni,et al. High-resolution chemical imaging with scanning ion probe SIMS , 1995 .
[9] H. Arimoto,et al. Novel Method for Measuring Intensity Distribution of Focused Ion Beams , 1983 .