Converting March tests for bit-oriented memories into tests for word-oriented memories

In this paper a set of fault models for coupling faults between the cells of a word has been established, together with tests for these fault models. Thereafter, a systematic way of converting tests for bit-oriented memories into tests for word-oriented memories is presented, distinguishing between inter-word and intra-word faults. This results in more efficient tests with complete coverage of the targeted faults. Because most memories have an external data path which is wider than one bit, word-oriented memory tests are very important.