Real-time double exposure holographic phase shifting interferometer using a photorefractive crystal

Abstract We present a double exposure interferometer using a Bi12GeO20 crystal as the holographic medium. Once the system is calibrated, the simultaneous acquisition of two phase shifted interferograms allows the real-time quantitative measurement of displacements of a scattering object. Experiments are conducted first with a chopped CW argon laser at 514 nm and second with 694 nm nanosecond pulses from a ruby laser. At 514 nm the accuracy is λ 29 ; it reduces to λ 15 at 694 nm.

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