Experimental observation of contact mode cantilever dynamics with nanosecond resolution.

We report the use of a laser Doppler vibrometer to measure the motion of an atomic force microscope contact mode cantilever during continuous line scans of a mica surface. With a sufficiently high density of measurement points the dynamics of the entire cantilever beam, from the apex to the base, can be reconstructed. We demonstrate nanosecond resolution of both rectangular and triangular cantilevers. This technique permits visualization and quantitative measurements of both the normal and lateral tip sample interactions for the first and higher order eigenmodes. The ability to derive quantitative lateral force measurements is of interest to the field of microtribology/nanotribology while the comprehensive understanding of the cantilever's dynamics also aids new cantilever designs and simulations.

[1]  J. Sader,et al.  Method for the calibration of atomic force microscope cantilevers , 1995 .

[2]  Fabrication and evaluation of single-crystal silicon cantilevers with ultra-low spring constants , 2005 .

[3]  Bharat Bhushan,et al.  New technique for studying nanoscale friction at sliding velocities up to 200mm∕s using atomic force microscope , 2006 .

[4]  Robert W. Stark,et al.  Higher harmonics imaging in tapping-mode atomic-force microscopy , 2003 .

[5]  Martin Stark,et al.  Inverting dynamic force microscopy: From signals to time-resolved interaction forces , 2002, Proceedings of the National Academy of Sciences of the United States of America.

[6]  A Ulcinas,et al.  High-speed AFM of human chromosomes in liquid , 2008, Nanotechnology.

[7]  Arvind Raman,et al.  Cantilever dynamics in atomic force microscopy , 2008 .

[8]  T. Hugel,et al.  The Study of Molecular Interactions by AFM Force Spectroscopy , 2001 .

[9]  Matthias M. Müller,et al.  Finite element analysis of V‐shaped cantilevers for atomic force microscopy under normal and lateral force loads , 2006 .

[10]  Bharat Bhushan,et al.  A new atomic force microscopy based technique for studying nanoscale friction at high sliding velocities , 2005 .

[11]  A Ulcinas,et al.  Micro-fabricated mechanical sensors for lateral molecular-force microscopy. , 2011, Ultramicroscopy.

[12]  Robert W. Stark,et al.  Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation , 2000 .

[13]  R. Reifenberger,et al.  Flexural vibration spectra of carbon nanotubes measured using laser Doppler vibrometry , 2009, Nanotechnology.

[14]  Martin Stark,et al.  Higher-harmonics generation in tapping-mode atomic-force microscopy: Insights into the tip–sample interaction , 2000 .

[15]  A. Raman,et al.  Spatio-temporal dynamics of microcantilevers tapping on samples observed under an atomic force microscope integrated with a scanning laser Doppler vibrometer: applications to proper orthogonal decomposition and model reduction , 2010 .

[16]  N. Amer,et al.  Novel optical approach to atomic force microscopy , 1988 .

[17]  Robert W. Carpick,et al.  Calibration of frictional forces in atomic force microscopy , 1996 .

[18]  Roger Proksch,et al.  Multifrequency, repulsive-mode amplitude-modulated atomic force microscopy , 2006 .

[19]  T. Sulzbach,et al.  Bimodal atomic force microscopy imaging of isolated antibodies in air and liquids , 2008, Nanotechnology.

[20]  D. Gethin,et al.  Simulation of atomic force microscopy operation via three-dimensional finite element modelling , 2009, Nanotechnology.

[21]  Ricardo Garcia,et al.  Nanoscale compositional mapping with gentle forces. , 2007, Nature materials.

[22]  Liang-Chia Chen,et al.  Dynamic Surface Profilometry and Resonant-Mode Detection for Microstructure Characterization Using Nonconventional Stroboscopic Interferometry , 2010, IEEE Transactions on Industrial Electronics.