Simple method for estimating neutron-induced soft error rates based on modified BGR model

Recently the importance of cosmic ray neutron-induced soft errors has been recognized. We propose a simple model to estimate the neutron-induced soft error rates (SER's), which is a modified version of the burst generation rate (BGR) model. Our model can be used to easily and quickly estimate neutron-induced soft error rates and provides a useful guideline for device and circuit engineers to estimate neutron-induced soft errors (SE's),.

[1]  D. E. Russell,et al.  Cosmic ray neutron induced upsets as a major contributor to the soft error rate of current and future generation DRAMs , 1996, Proceedings of International Reliability Physics Symposium.

[2]  James F. Ziegler,et al.  Terrestrial cosmic rays , 1996, IBM J. Res. Dev..

[3]  E. Normand.  Single event upset at ground level , 1996 .

[4]  J. Ziegler,et al.  Effect of Cosmic Rays on Computer Memories , 1979, Science.

[5]  S. M. Sze,et al.  Physics of semiconductor devices , 1969 .

[6]  T. J. O'Gorman.  The effect of cosmic rays on the soft error rate of a DRAM at ground level , 1994 .

[7]  G. R. Srinivasan,et al.  Soft-error Monte Carlo modeling program, SEMM , 1996, IBM J. Res. Dev..

[8]  James L. Walsh,et al.  Field testing for cosmic ray soft errors in semiconductor memories , 1996, IBM J. Res. Dev..

[9]  T. Sugii,et al.  Impact of cosmic ray neutron induced soft errors on advanced submicron CMOS circuits , 1996, 1996 Symposium on VLSI Technology. Digest of Technical Papers.

[10]  Yoshiharu Tosaka,et al.  Measurement and analysis of neutron-induced soft errors in sub-half-micron CMOS circuits , 1998 .

[11]  James F. Ziegler,et al.  The effect of sea level cosmic rays on electronic devices , 1981 .

[12]  E. Normand,et al.  Guidelines for predicting single-event upsets in neutron environments (RAM devices) , 1991 .

[13]  Y. Tosaka,et al.  Cosmic ray neutron-induced soft errors in sub-half micron CMOS circuits , 1997, IEEE Electron Device Letters.

[15]  Toshihiro Sugii,et al.  Measurements and analysis of neutron-reaction-induced charges in a silicon surface region , 1997 .