Single event upset rates on 1 Mbit and 256 Kbit memories: CRUX experiment on APEX
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Kenneth A. LaBel | E. G. Stassinopoulos | M. Wennersten | Janet L. Barth | T. Gruner | Christina Seidleck | K. Label | J. Barth | C. Seidleck | E. Stassinopoulos | J. Adolphsen | J. Adolphsen | T. Gruner | M. Wennersten
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