Impact of probe configuration and calibration techniques on quality factor determination of on-wafer inductors for GHz applications
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[1] J.A.M. Geelen,et al. An improved de-embedding technique for on-wafer high-frequency characterization , 1991, Proceedings of the 1991 Bipolar Circuits and Technology Meeting.
[2] L.F. Tiemeijer,et al. Record Q spiral inductors in standard CMOS , 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
[3] R. Brock,et al. QUBiC4: a silicon RF-BiCMOS technology for wireless communication ICs , 2001, Proceedings of the 2001 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.01CH37212).
[4] Keith Jones,et al. LRM and LRRM Calibrations with Automatic Determination of Load Inductance , 1990, 36th ARFTG Conference Digest.
[5] Roger B. Marks,et al. Comparison of On-Wafer Calibrations , 1991, 38th ARFTG Conference Digest.
[6] D.B.M. Klaassen,et al. A record high 150 GHz f/sub max/ realized at 0.18 /spl mu/m gate length in an industrial RF-CMOS technology , 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).