The influence of surface diffusion on surface roughness and component distribution profiles during deposition of multilayers

[1]  I. Busch,et al.  Investigation of interface roughness and roughness correlation in solid-state multilayer by coplanar diffuse X-ray scattering , 2003 .

[2]  A. Meunier,et al.  Interdiffusion and magnetism in Ni/Cu multilayers , 2003 .

[3]  J. Kovač,et al.  Quantification of AES depth profiles by the MRI model , 2003 .

[4]  J. Rivière,et al.  On the mechanism of synthesis of PbTiO3 thin films by thermal annealing of Pb/Ti layers in air at atmospheric pressure , 2003 .

[5]  B. Derby,et al.  Multilayer nitride coatings by closed field unbalanced magnetron sputter ion plating , 2003 .

[6]  N. Barradas Fitting of RBS data including roughness: Application to Co/Re multilayers , 2002 .

[7]  D. Hensley,et al.  Enhanced tissue adhesion by increased porosity and surface roughness of carbon based biomaterials , 2002 .

[8]  Junying Chen,et al.  Plasma-surface modification of biomaterials , 2002 .

[9]  V. Ustinov,et al.  Effect of interface structure on magnetic and magnetoresistive properties of Fe/Cr multilayers , 2002 .

[10]  Z. Kowalski Ion sputter induced surface morphology—biomedical implications , 2001 .

[11]  A. Chayahara,et al.  Enhanced interfacial roughness in metallic multilayers prepared by pulsed cathodic arc deposition , 2000 .

[12]  A. Galdikas,et al.  Interaction of ions with condensed matter , 2000 .

[13]  D. Moon,et al.  Original and sputtering induced interface roughness in AES sputter depth profiling of SiO2/Ta2O5 multilayers , 1999 .

[14]  A. Galdikas Surface topography development and ion mixing in the study of depth profiling of multilayered structures , 1999 .

[15]  F. Cui,et al.  Biomaterials modification by ion-beam processing , 1999 .

[16]  G. Gładyszewski,et al.  Ion-assisted deposition of Ag(001)/Fe(001) multilayers: interface roughness , 1998 .

[17]  C. Templier,et al.  The composition changes induced by surface roughening and mixing during the ion profiling of multilayers , 1998 .

[18]  M. Stepanova Effect of Ion Beam Mixing and Compound Formation on Sputter Depth Profile of a Ta/Si Multilayer Thin Film , 1996 .

[19]  M. Drozdov,et al.  High-resolution Auger depth profiling of multilayer structures Mo/Si, Mo/B4C, Ni/C , 1995 .