Experimental phase-error extraction and modelling in silicon photonic arrayed waveguide gratings

We present a detailed study of parameter sweeps of silicon photonic arrayed waveguide gratings (AWG), looking into the effects of phase errors in the delay lines, which are induced by fabrication variation. We fabricated AWGs with 8 wavelength channels spaced 200 GHz and 400 GHz apart. We swept the waveguide width of the delay lines, and also performed a sweep where we introduced increments of length to the waveguides to emulate different AWG layouts and look into the effect of the phase errors. With this more detailed study we could quantitatively confirm the results of earlier studies, showing the wider waveguides reduce the effect of phase errors and dramatically improve the performance of the AWGs in terms of insertion loss and crosstalk. We also looked into the effect of rotating the layout of the circuit on the mask, and here we could show that, contrary to results with older technologies, this no longer has an effect on the current generation of devices.

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