A low-cost single-event latchup mitigation scheme

Single-event latchup is one of the most threatening single event effects as the induced current may destroy the affected device. Existing latchup mitigation schemes may induce a very high area cost or may require modifying the fabrication process. In this paper we present a new single-event latchup mitigation approach implemented at design level that protects devices from destruction and preserve circuit state at very low area cost

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