Microstructural and bulk properties evolution of cold-sprayed copper coatings after low temperature annealing
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J. Legoux | D. Poirier | J. Giallonardo | U. Erb | H. Cho | W. Li | B. Yu | J. Tam | H.J. Cho
暂无分享,去创建一个
J. Legoux | D. Poirier | J. Giallonardo | U. Erb | H. Cho | W. Li | B. Yu | J. Tam | H.J. Cho