Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive test

Pseudo-exhaustive test completely verifies all output functions of a combinational circuit, which provides a high coverage of non-target faults and allows an efficient on-chip implementation. To avoid long test times caused by large output cones, partial pseudo-exhaustive test (P-PET) has been proposed recently. Here only cones with a limited number of inputs are tested exhaustively, and the remaining faults are targeted with deterministic patterns. Using P-PET patterns for built-in diagnosis, however, is challenging because of the large amount of associated response data. This paper presents a built-in diagnosis scheme which only relies on sparsely distributed data in the response sequence, but still preserves the benefits of P-PET.

[1]  Hans-Joachim Wunderlich,et al.  Structural In-Field Diagnosis for Random Logic Circuits , 2011, 2011 Sixteenth IEEE European Test Symposium.

[2]  Enamul Amyeen,et al.  Logic BIST silicon debug and volume diagnosis methodology , 2011, 2011 IEEE International Test Conference.

[3]  Arnold L. Rosenberg,et al.  Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing , 1983, IEEE Transactions on Computers.

[4]  Hans-Joachim Wunderlich,et al.  A diagnosis algorithm for extreme space compaction , 2009, 2009 Design, Automation & Test in Europe Conference & Exhibition.

[5]  Hans-Joachim Wunderlich,et al.  Built-in self-diagnosis exploiting strong diagnostic windows in mixed-mode test , 2012, 2012 17th IEEE European Test Symposium (ETS).

[6]  Edward J. McCluskey Verification Testing - A Pseudoexhaustive Test Technique , 1984, IEEE Trans. Computers.

[7]  Hans-Joachim Wunderlich,et al.  Diagnostic Test of Robust Circuits , 2011, 2011 Asian Test Symposium.

[8]  Hans-Joachim Wunderlich,et al.  P-PET: Partial pseudo-exhaustive test for high defect coverage , 2011, 2011 IEEE International Test Conference.