Contribution of CIRP to the Development of Metrology and Surface Quality Evaluation during the last fifty years
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Hisayoshi Sato | S. Sartori | Paul Vanherck | H. Trumpold | Jacques Peters | Theodore V. Vorburger | Robert J. Hocken | Don A. Lucca | Christopher J. Evans | E. G. Thwaite | Tilo Pfeifer | J. Peklenik | H. Kunzmann | William T. Estler | J. B. Bryan | R. Hocken | C. Evans | J. Bryan | D. Lucca | H. Kunzmann | S. Sartori | T. Vorburger | W. Estler | H. Trumpold | P. Vanherck | J. Peters | T. Pfeifer | J. Peklenik | Hisayoshi Sato | E. Thwaite
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