Secure Split-Test for preventing IC piracy by untrusted foundry and assembly
暂无分享,去创建一个
[1] Joseph Zambreno,et al. Preventing IC Piracy Using Reconfigurable Logic Barriers , 2010, IEEE Design & Test of Computers.
[2] Srinivas Devadas,et al. Silicon physical random functions , 2002, CCS '02.
[3] Berk Sunar,et al. A Provably Secure True Random Number Generator with Built-In Tolerance to Active Attacks , 2007, IEEE Transactions on Computers.
[4] Miodrag Potkonjak,et al. Intellectual Property Metering , 2001, Information Hiding.
[5] W. Marsden. I and J , 2012 .
[6] Jorge Guajardo,et al. FPGA Intrinsic PUFs and Their Use for IP Protection , 2007, CHES.
[7] Jarrod A. Roy,et al. EPIC: Ending Piracy of Integrated Circuits , 2008, 2008 Design, Automation and Test in Europe.
[8] John M. DeLaurentis,et al. A Further Weakness in the Common Modulus Protocol for the RSA Cryptoalgorithm , 1984, Cryptologia.
[9] J. Stradley,et al. The Electronic Part Supply Chain and Risks of Counterfeit Parts in Defense Applications , 2006, IEEE Transactions on Components and Packaging Technologies.
[10] John B. Shoven,et al. I , Edinburgh Medical and Surgical Journal.
[11] Vishwani D. Agrawal,et al. Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits [Book Review] , 2000, IEEE Circuits and Devices Magazine.
[12] Farinaz Koushanfar,et al. Active Hardware Metering for Intellectual Property Protection and Security , 2007, USENIX Security Symposium.
[13] Paul C. Kocher,et al. The intel random number generator , 1999 .
[14] G. Edward Suh,et al. Physical Unclonable Functions for Device Authentication and Secret Key Generation , 2007, 2007 44th ACM/IEEE Design Automation Conference.
[15] D. Das,et al. Semiconductor Manufacturers' Efforts to Improve Trust in the Electronic Part Supply Chain , 2007, IEEE Transactions on Components and Packaging Technologies.
[16] Gary L. Miller. Riemann's Hypothesis and Tests for Primality , 1976, J. Comput. Syst. Sci..
[17] Wang Yang,et al. A novel ASIC implementation of RSA algorithm , 2003, ASICON 2003.
[18] H. Livingston. Avoiding Counterfeit Electronic Components , 2007, IEEE Transactions on Components and Packaging Technologies.
[19] W. R. Daasch,et al. IC identification circuit using device mismatch , 2000, 2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.00CH37056).
[20] Ingrid Verbauwhede,et al. Low Cost Built in Self Test for Public Key Crypto Cores , 2010, 2010 Workshop on Fault Diagnosis and Tolerance in Cryptography.