Two-dimensional displacement measurement based on two parallel gratings.

In this paper, a two-dimensional (2-D) planar encoder based on two parallel gratings, which includes a scanning grating and scale grating, is presented. The scanning grating is a combined transmission rectangular grating comprised of a 2-D grating located at the center and two one-dimensional (1-D) gratings located at the sides. The grating lines of the two 1-D gratings are perpendicular to each other and parallel with the 2-D grating lines. The scale grating is a 2-D reflective-type rectangular grating placed in parallel with the scanning grating, and there is an angular difference of 45° between the grating lines of the two 2-D gratings. With the special structural design of the scanning grating, the encoder can measure the 2-D displacement in the grating plane simultaneously, and the measured interference signals in the two directions are uncoupled. Moreover, by utilizing the scanning grating to modulate the phase of the interference signals instead of the prisms, the structure of the encoder is compact. Experiments were implemented, and the results demonstrate the validity of the 2-D planar grating encoder.

[1]  Olivier Parriaux,et al.  Compact diffractive interferometric displacement sensor in reflection , 2002 .

[2]  W. Arden Future semiconductor material requirements and innovations as projected in the ITRS 2005 roadmap , 2006 .

[3]  Kuang-Chao Fan,et al.  Linear diffraction grating interferometer with high alignment tolerance and high accuracy. , 2011, Applied optics.

[4]  Jiubin Tan,et al.  Two-degree-of-freedom displacement measurement system based on double diffraction gratings , 2016 .

[5]  N. Bobroff,et al.  Residual errors in laser interferometry from air turbulence and nonlinearity. , 1987, Applied optics.

[6]  Lijiang Zeng,et al.  A sub-nanometric three-axis surface encoder with short-period planar gratings for stage motion measurement , 2012 .

[7]  Wen-Yuh Jywe,et al.  Development of a three-degree-of-freedom laser linear encoder for error measurement of a high precision stage. , 2007 .

[8]  Kuang-Chao Fan,et al.  Diffractive Laser Encoder with a Grating in Littrow Configuration , 2008 .

[9]  Wei Gao,et al.  Position and out-of-straightness measurement of a precision linear air-bearing stage by using a two-degree-of-freedom linear encoder , 2010 .

[10]  Wang Xuanze,et al.  Two-dimensional displacement sensing using a cross diffraction grating scheme , 2004 .

[11]  Cheng-Chih Hsu,et al.  Heterodyne common-path grating interferometer with Littrow configuration. , 2013, Optics express.

[12]  Yongsheng Shi,et al.  Design and development of an optical encoder with sub-micron accuracy using a multiple-tracks analyser grating. , 2017, The Review of scientific instruments.

[13]  Yongsheng Shi,et al.  Optimizing design of an optical encoder based on generalized grating imaging , 2016 .

[14]  David L. Trumper,et al.  The long-range scanning stage: a novel platform for scanned-probe microscopy , 2000 .

[15]  Yongsheng Shi,et al.  Development of a reflective optical encoder with submicron accuracy , 2018 .

[16]  Wei Gao,et al.  A six-degree-of-freedom surface encoder for precision positioning of a planar motion stage , 2013 .