Peridynamic wetness approach for moisture concentration analysis in electronic packages

Within the finite element framework, a commonly accepted indirect approach employs the concept of normalized concentration to compute moisture concentration. It is referred to as “wetness” approach. If the saturated concentration value is not dependent on temperature or time, the wetness equation is analogous to the standard diffusion equation whose solution can be constructed by using any commercial finite element analysis software such as ANSYS. However, the time dependency of saturated concentration requires special treatment under temperature dependent environmental conditions such as reflow process. As a result, the wetness equation is not directly analogous to the standard diffusion equation. This study presents the peridynamic wetness modeling for time dependent saturated concentration for computation of moisture concentration in electronic packages. It is computationally efficient as well as easy to implement without any iterations in each time step. Numerical results concerning the one-dimensional analysis illustrate the accuracy of this approach. Moisture concentration calculation in a three-dimensional electronic package configuration with many different material layers demonstrates its robustness.

[1]  Xunqing Shi,et al.  Direct Concentration Approach of Moisture Diffusion and Whole-Field Vapor Pressure Modeling for Reflow Process—Part I: Theory and Numerical Implementation , 2009 .

[2]  A. Nishimura,et al.  Analysis of package cracking during reflow soldering process , 1988, 26th Annual Proceedings Reliability Physics Symposium 1988.

[3]  Xuejun Fan,et al.  A new method for equivalent acceleration of JEDEC moisture sensitivity levels , 2008, 2008 58th Electronic Components and Technology Conference.

[4]  Selda Oterkus,et al.  Peridynamic thermal diffusion , 2014, J. Comput. Phys..

[5]  Bongtae Han,et al.  Advanced Thermal-Moisture Analogy Scheme for Anisothermal Moisture Diffusion Problem , 2008 .

[6]  Erkan Oterkus,et al.  Peridynamic Theory and Its Applications , 2013 .

[7]  Ee-Hua Wong,et al.  Moisture diffusion modeling - A critical review , 2016, Microelectron. Reliab..

[8]  Thiam Beng Lim,et al.  Moisture diffusion and vapour pressure modeling of IC packaging , 1998, 1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206).

[9]  R. L. Shook,et al.  Method for equivalent acceleration of JEDEC/IPC moisture sensitivity levels , 1998, 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173).

[10]  Ee-Hua Wong,et al.  The fundamentals of thermal-mass diffusion analogy , 2015, Microelectron. Reliab..

[11]  S. Silling Reformulation of Elasticity Theory for Discontinuities and Long-Range Forces , 2000 .

[12]  Ranjan Rajoo,et al.  Advanced moisture diffusion modeling and characterisation for electronic packaging , 2002, 52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345).