Vibration control of a novel tube scanner using piezoelectric strain-induced voltage
暂无分享,去创建一个
[1] D. Croft,et al. Creep, Hysteresis, and Vibration Compensation for Piezoactuators: Atomic Force Microscopy Application , 2001 .
[2] S. O. Reza Moheimani,et al. High-Performance Control of Piezoelectric Tube Scanners , 2007, IEEE Transactions on Control Systems Technology.
[3] S.O.R. Moheimani,et al. PVPF control of piezoelectric tube scanners , 2006, SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring.
[4] Murti V. Salapaka,et al. High bandwidth nano-positioner: A robust control approach , 2002 .
[5] A. Stemmer,et al. Fast contact-mode atomic force microscopy on biological specimen by model-based control. , 2004, Ultramicroscopy.
[6] W. Häberle,et al. The "millipede" - nanotechnology entering data storage , 2002 .
[7] I. Schmitz,et al. Phase imaging as an extension to tapping mode AFM for the identification of material properties on humidity-sensitive surfaces , 1997 .
[8] Y. Yong,et al. Simultaneous sensing and actuation with a piezoelectric tube scanner. , 2008, The Review of scientific instruments.
[9] E. Meyer,et al. Scanning Probe Microscopy , 2021, Graduate Texts in Physics.
[10] D. Leo. Engineering Analysis of Smart Material Systems , 2007 .
[11] S. S. Aphale,et al. High speed nano-scale positioning using a piezoelectric tube actuator with active shunt control , 2007 .
[12] Santosh Devasia,et al. Optimal tracking of piezo-based nanopositioners , 1999 .
[13] G. Binnig,et al. Single-tube three-dimensional scanner for scanning tunneling microscopy , 1986 .
[14] B. Bhushan,et al. Development of AFM-based techniques to measure mechanical properties of nanoscale structures , 2002 .
[15] Qingze Zou,et al. Iterative Control Approach to Compensate for Both the Hysteresis and the Dynamics Effects of Piezo Actuators , 2007, IEEE Transactions on Control Systems Technology.
[16] K. L. Mittal,et al. Atomic force microscopy in adhesion studies , 2005 .
[17] F. Allgöwer,et al. High performance feedback for fast scanning atomic force microscopes , 2001 .
[18] Kazushi Yamanaka,et al. Quantitative material characterization by ultrasonic AFM , 1999 .
[19] Ernst Meyer,et al. Scanning Probe Microscopy: The Lab on a Tip , 2021 .
[20] Donald J. Leo,et al. Engineering Analysis of Smart Material Systems: Leo/Smart Material Systems , 2008 .
[21] Yuen Kuan Yong,et al. Design, Identification, and Control of a Flexure-Based XY Stage for Fast Nanoscale Positioning , 2009, IEEE Transactions on Nanotechnology.
[22] Santosh Devasia,et al. A Survey of Control Issues in Nanopositioning , 2007, IEEE Transactions on Control Systems Technology.
[23] S O Reza Moheimani,et al. Invited review article: accurate and fast nanopositioning with piezoelectric tube scanners: emerging trends and future challenges. , 2008, The Review of scientific instruments.
[24] Mohammed Dahleh,et al. Feedback control of piezoelectric tube scanners , 1994, Proceedings of 1994 33rd IEEE Conference on Decision and Control.
[25] S. O. Reza Moheimani,et al. Sensor-less Vibration Suppression and Scan Compensation for Piezoelectric Tube Nanopositioners , 2005, CDC 2005.