Grazing incidence reflectivity and total electron yield effects in soft x-ray absorption spectroscopy

We report on a study of grazing incidence absorption and reflection spectra of NiO in the region of the Ni 2p edge. The aim is to evaluate the distortion of the near edge spectrum by the critical angle behavior of individual components within the spectrum. This can be used to improve the separation of multiplets and enhance low spectral weight line shapes like charge transfer satellites. The measured spectra have been compared with calculations using an optical model.

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