论文信息 - Charge collection efficiency degradation induced by MeV ions in semiconductor devices: Model and experiment - 字舞流文

Charge collection efficiency degradation induced by MeV ions in semiconductor devices: Model and experiment

M. Breese | G. Vizkelethy | J. G. López | M. Jakšić | J. Räisänen | R. Siegele | E. Vittone | A. Simon | Ž. Pastuović