Design and performance of a scanning ptychography microscope.

We have designed and constructed a dedicated instrument to perform ptychography measurements and characterization of multilayer Laue lenses nanofocusing optics. The design of the scanning microscope provides stability of components and minimal thermal drifts, requirements for nanometer scale spatial resolution measurements. We performed thorough laboratory characterization of the instrument in terms of resolution and thermal drifts with subsequent measurements at a synchrotron. We have successfully acquired and reconstructed ptychography data yielding 11 nm line focus.

[1]  J. Rodenburg,et al.  Movable aperture lensless transmission microscopy: a novel phase retrieval algorithm. , 2004, Physical review letters.

[2]  Ian K Robinson,et al.  Quantitative X-ray wavefront measurements of Fresnel zone plate and K-B mirrors using phase retrieval. , 2012, Optics express.

[3]  T Salditt,et al.  Sub-5 nm hard x-ray point focusing by a combined Kirkpatrick-Baez mirror and multilayer zone plate. , 2013, Optics express.

[4]  Evgeny Nazaretski,et al.  Optomechanical Design of a Multilayer Laue Lens Test Bed for 10-nm Focusing of Hard X-rays , 2013 .

[5]  Jungdae Kim,et al.  Performance and characterization of the prototype nm-scale spatial resolution scanning multilayer Laue lenses microscope. , 2013, The Review of scientific instruments.

[6]  Tim Salditt,et al.  Hard x-ray nanobeam characterization by coherent diffraction microscopy , 2010 .

[7]  Jörg Maser,et al.  Oxidation of PtNi nanoparticles studied by a scanning X-ray fluorescence microscope with multi-layer Laue lenses. , 2013, Nanoscale.

[8]  Jörg Maser,et al.  Quantitative x-ray phase imaging at the nanoscale by multilayer Laue lenses , 2013, Scientific Reports.

[9]  A. Diaz,et al.  Translation position determination in ptychographic coherent diffraction imaging. , 2013, Optics express.

[10]  T. Ishikawa,et al.  Breaking the 10 nm barrier in hard-X-ray focusing , 2010 .

[11]  Manuel Guizar-Sicairos,et al.  Reconstruction of an astigmatic hard X-ray beam and alignment of K-B mirrors from ptychographic coherent diffraction data. , 2010, Optics express.

[12]  J. Fienup,et al.  Phase retrieval with transverse translation diversity: a nonlinear optimization approach. , 2008, Optics express.

[13]  E. Nazaretski,et al.  Design of a variable temperature scanning force microscope. , 2009, The Review of scientific instruments.

[14]  Li Li,et al.  11 nm hard X-ray focus from a large-aperture multilayer Laue lens , 2013, Scientific Reports.

[15]  Hanfei Yan,et al.  Optimization of multilayer Laue lenses for a scanning X-ray microscope. , 2013, Journal of synchrotron radiation.

[16]  Jörg Maser,et al.  Two dimensional hard x-ray nanofocusing with crossed multilayer Laue lenses. , 2011, Optics express.

[17]  Jörg Maser,et al.  Focusing of hard x-rays to 16 nanometers with a multilayer Laue lens , 2008 .

[18]  O. Bunk,et al.  X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution , 2014, Scientific Reports.

[19]  Christian G. Schroer,et al.  Multilayer Laue Lenses with Focal Length of 10 mm , 2013 .

[20]  J. Rodenburg,et al.  An annealing algorithm to correct positioning errors in ptychography. , 2012, Ultramicroscopy.

[21]  Hidekazu Mimura,et al.  Direct determination of the wave field of an x-ray nanobeam , 2008 .

[22]  O. Bunk,et al.  High-Resolution Scanning X-ray Diffraction Microscopy , 2008, Science.

[23]  A. Diaz,et al.  Coherent x-ray wavefront reconstruction of a partially illuminated Fresnel zone plate. , 2011, Optics express.

[24]  Xavier Levecq,et al.  X-ray active mirror coupled with a Hartmann wavefront sensor , 2010 .

[25]  Suresh Narayanan,et al.  One-dimensional hard x-ray field retrieval using a moveable structure. , 2010, Optics express.

[26]  H. C. Kang,et al.  Nanometer linear focusing of hard x rays by a multilayer Laue lens. , 2006, Physical review letters.