ENDBOSS: Industrial endpoint detection using batch-specific control spaces of spectroscopic data
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Lutgarde M. C. Buydens | Jeroen J. Jansen | Tim Offermans | Thanh N. Tran | Rita Folcarelli | Terry-Hale Wijker | Rudi Heemskerk | Packo P. Lamers | Maria Proença | L. Buydens | T. Tran | P. Lamers | J. Jansen | R. Folcarelli | M. Proença | Tim Offermans | Terry-Hale Wijker | Rudi Heemskerk
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