A Dedicated TLP Set-Up to Investigate the ESD Robustness of RF Elements and Circuits
暂无分享,去创建一个
[1] Bart Keppens,et al. ESD protection solutions for high voltage technologies , 2004 .
[2] Robert W. Dutton,et al. RF ESD protection strategies: Codesign vs. low-C protection , 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium.
[3] H. Gieser,et al. Very fast transmission line pulsing of integrated structures and the charged device model , 1998, IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part C.
[4] E. Rosenbaum,et al. Combined TLP/RF testing system for detection of ESD failures in RF circuits , 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium.