Measurement of mechanical properties of three-dimensional nanometric objects by an atomic force microscope incorporated in a scanning electron microscope
暂无分享,去创建一个
Daisuke Saya | Hideki Kawakatsu | Shigeki Kawai | H. Kawakatsu | S. Kawai | D. Saya | Kimitake Fukushima | K. Fukushima
[1] Michel Troyon,et al. A Scanning Force Microscope Combined with a Scanning Electron Microscope for Multidimensional Data Analysis , 1997 .
[2] Toshiro Higuchi,et al. A dual tunneling‐unit scanning tunneling microscope , 1990 .
[3] C. Heiden,et al. Simple micropositioning devices for STM , 1987 .
[4] Daisuke Saya,et al. Development of a Versatile Atomic Force Microscope within a Scanning Electron Microscope , 2000 .
[5] S. Okuma,et al. A method for determining the spring constant of cantilevers for atomic force microscopy , 1996 .
[6] Pascal Gallo,et al. Materials" properties measurements: Choosing the optimal scanning probe microscope configuration , 1996 .
[7] M. R. Scanlon,et al. The determination of the elastic modulus of microcantilever beams using atomic force microscopy , 2000 .
[8] P. Niedermann,et al. Simple piezoelectric translation device , 1988 .
[9] N. Amer,et al. Novel optical approach to atomic force microscopy , 1988 .
[10] D. Pohl. Dynamic piezoelectric translation devices , 1987 .
[11] M. Tortonese,et al. Atomic force microscope using piezoresistive cantilevers and combined with a scanning electron microscope , 1994 .
[12] E. Garfunkel,et al. A novel AFM/STM/SEM system , 1994 .
[13] H. Hansma,et al. Atomic force microscope integrated with a scanning electron microscope for tip fabrication , 1994 .
[14] Sumio Hosaka,et al. Magnetic force microscope combined with a scanning electron microscope , 1993 .
[15] B. W. Corb,et al. An electromagnetic microscopic positioning device for the scanning tunneling microscope , 1985 .