Design of mechanical components for vibration reduction in an atomic force microscope.
暂无分享,去创建一个
Kyihwan Park | Woosub Youm | Jongkyu Jung | Chulsoo Kim | Kyihwan Park | Jongkyu Jung | Woosub Youm | Chulsoo Kim
[1] J. Gilman,et al. Nanotechnology , 2001 .
[2] T. Ando,et al. A high-speed atomic force microscope for studying biological macromolecules , 2001, Proceedings of the National Academy of Sciences of the United States of America.
[3] Gerd Binnig,et al. Atomic Resolution with Atomic Force Microscope , 1987 .
[4] Qingze Zou,et al. Iterative control of dynamics-coupling-caused errors in piezoscanners during high-speed AFM operation , 2005, IEEE Transactions on Control Systems Technology.
[5] H. Butt,et al. Force measurements with the atomic force microscope: Technique, interpretation and applications , 2005 .
[6] Xiaotang Hu,et al. Analysis on vibration rejection ratio of scanning probe microscope , 2009 .
[7] Jonathan D. Adams,et al. Components for high speed atomic force microscopy. , 2006, Ultramicroscopy.
[8] A. Fleming,et al. Bridging the gap between conventional and video-speed scanning probe microscopes. , 2010, Ultramicroscopy.
[9] R. Curtis,et al. An ultrahigh vacuum high speed scanning tunneling microscope , 1997 .
[10] Srinivasa M. Salapaka,et al. Design methodologies for robust nano-positioning , 2005, IEEE Transactions on Control Systems Technology.
[11] M. Kryder,et al. Near‐field magneto‐optics and high density data storage , 1992 .
[12] Jacqueline A. Cutroni,et al. Rigid design of fast scanning probe microscopes using finite element analysis. , 2004, Ultramicroscopy.
[13] G. Binnig,et al. Single-tube three-dimensional scanner for scanning tunneling microscopy , 1986 .
[14] Jan Greve,et al. A detailed analysis of the optical beam deflection technique for use in atomic force microscopy , 1992 .
[15] Bhanwar Singh,et al. Electron beam and scanning probe lithography: A comparison , 1998 .
[16] Vincent D. Blondel,et al. Proceedings of the 2000 American Control Conference , 2000, Proceedings of the 2000 American Control Conference. ACC (IEEE Cat. No.00CH36334).
[17] 宁北芳,et al. 疟原虫var基因转换速率变化导致抗原变异[英]/Paul H, Robert P, Christodoulou Z, et al//Proc Natl Acad Sci U S A , 2005 .
[18] Paul K. Hansma,et al. Assessing the quality of scanning probe microscope designs , 2001 .
[19] G. Schitter. Advanced Mechanical Design and Control Methods for Atomic Force Microscopy in Real-Time , 2007, 2007 American Control Conference.
[20] A. F. Seybert,et al. Estimation of damping from response spectra , 1981 .
[21] Karl Johan Åström,et al. Design and Modeling of a High-Speed AFM-Scanner , 2007, IEEE Transactions on Control Systems Technology.
[22] Sang-il Park,et al. Atomic force microscope with improved scan accuracy, scan speed, and optical vision , 2003 .