论文信息 - Inevitable use of TAP domains in SOCs

Inevitable use of TAP domains in SOCs

This paper discusses the use of test access ports (TAPs) in systems-on-chip (SOC). Topics covered include: IEEE 1149.1, IEEE P1500 and associated standards; TAP controllers; TAP protocols; SOC multiple TAP domains; self-checking; embedded core test standards; core test wrapper architecture; and serial/parallel access test mechanisms.

Lee Whetsel

[1] Lee Whetsel,et al. An IEEE 1149.1 based test access architecture for ICs with embedded cores , 1997, Proceedings International Test Conference 1997.

[2] Edward J. McCluskey,et al. Design for testability and testing of IEEE 1149.1 TAP controller , 2002, Proceedings 20th IEEE VLSI Test Symposium (VTS 2002).

[3] Rodham E. Tulloss,et al. The Test Access Port and Boundary Scan Architecture , 1990 .