Automatic defect inspection of patterned thin film transistor-liquid crystal display (TFT-LCD) panels using one-dimensional Fourier reconstruction and wavelet decomposition
暂无分享,去创建一个
C.-Y. Hung | D.-M. Tsai | D. Tsai | C. Hung
[1] Takashi Kido. IN-PROCESS INSPECTION TECHNIQUE FOR ACTIVE-MATRIX LCD PANELS , 1992, Proceedings International Test Conference 1992.
[2] Chern-Sheng Lin,et al. A digital image-based measurement system for a LCD backlight module , 2001 .
[3] Takashi Kido. In-process functional inspection technique for TFT-LCD arrays , 1993 .
[4] Po-Lun Chen,et al. An effective method for evaluating the image-sticking effect of TFT-LCDs by interpretative modelling of optical measurements , 2000 .
[5] C. Burrus,et al. Introduction to Wavelets and Wavelet Transforms: A Primer , 1997 .
[6] K. Nakashima. Hybrid inspection system for LCD color filter panels , 1994, Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9).
[7] Tomonobu Motai,et al. Low-temperature poly-Si TFT-LCD with an integrated analog circuit , 2002 .
[8] T. Kido,et al. Optical charge-sensing method for testing and characterizing thin-film transistor arrays , 1995 .
[9] Jong Hwan Oh,et al. Line Defect Detection in TFT-LCD Using Directional Filter Bank and Adaptive Multilevel Thresholding , 2004 .
[10] J. Hawthorne,et al. Electro-optics technology tests flat-panel displays , 2000 .
[11] Sergey M. Sokolov,et al. Automatic vision system for final test of liquid crystal displays , 1992, Proceedings 1992 IEEE International Conference on Robotics and Automation.