论文信息 - Surface structure characterization by X-ray photoelectron diffraction of Sn ultra-thin films deposited on Pd(111) - 字舞流文

Surface structure characterization by X-ray photoelectron diffraction of Sn ultra-thin films deposited on Pd(111)

M. Carazzolle | R. Landers | A. de Siervo | P. Nascente | A. Pancotti | J.J. Silva | A. de Siervo