Measured distortion of the output-waveform of an integrated OPAMP due to substrate noise

In mixed signal applications, interference problems due to ground noise and substrate noise are well known. The problem is becoming very timely in applications, such as the logical control of analog amplifiers in monolithic technologies, because of two reasons: the use of higher clock frequencies and high speed logic circuitry, and the technologies moving into 1 /spl mu/ and submicron regions. In this paper, some measured results are reported on the effects caused by logical control pulses on the behavior of OPAMP's. The results were gained from sophisticated experiments, and can serve as a basis for further theoretical investigations. >