Boundary-Scan Testing

Boundary-Scan testing is aimed primarily at digital logic structures, although Boundary-Scan assets can provide invaluable resources for assisting with mixed digital/analog testing as well. This chapter covers various test approaches utilizing 1149.1.

[1]  Najmi T. Jarwala,et al.  A new framework for analyzing test generation and diagnosis algorithms for wiring interconnects , 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.

[2]  Philip N. King,et al.  Measuring Thermal Rises Due to Digital Device Overdriving , 1984, ITC.

[3]  Rodham E. Tulloss,et al.  The Test Access Port and Boundary Scan Architecture , 1990 .

[4]  Kenneth P. Parker Defect coverage of boundary-scan tests: what does it mean when a boundary-scan test passes? , 2003, International Test Conference, 2003. Proceedings. ITC 2003..

[5]  Kenneth P. Parker,et al.  Test coverage: what does it mean when a board test passes? , 2002, Proceedings. International Test Conference.

[6]  Najmi T. Jarwala,et al.  A unified theory for designing optimal test generation and diagnosis algorithms for board interconnects , 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.

[7]  Louis J. Sobotka The Effects of Backdriving Digital Integrated Circuits during In-Circuit Testing , 1982, ITC.

[8]  Frans de Jong,et al.  TESTING THE INTEGRITY OF THE BOUNDARY SCAN TEST INFRASTRUCTURE , 1991, 1991, Proceedings. International Test Conference.

[9]  William H. Kautz,et al.  Testing for Faults in Wiring Networks , 1974, IEEE Transactions on Computers.

[10]  Peter van den Eijnden,et al.  Boundary-Scan Test: A Practical Approach , 2011 .

[11]  Michael J. Ward,et al.  Thermal Analysis of Backdriven Output Transistors , 1986, ITC.

[12]  Gordon D. Robinson,et al.  Interconnect testing of boards with partial boundary scan , 1990, Proceedings. International Test Conference 1990.