Accelerated Compressed Sensing of Diffusion-Inferred Intra-Voxel Structure through Adaptive Refinement

B. A. Landman, H. Wan, J. A. Bogovic, P. C. van Zijl, P-L. Bazin, and J. L. Prince Electrical Engineering, Vanderbilt University, Nashville, TN, United States, Biomedical Engineering, Johns Hopkins University, Baltimore, MD, United States, Electrical and Computer Engineering, Johns Hopkins University, Baltimore, MD, United States, F.M. Kirby Center, Kennedy Krieger Institute, Baltimore, MD, United States, Biomedical Engineering, Johns Hopkins University, Nashville, TN, United States, Radiology, Johns Hopkins University, Baltimore, MD, United States