Reliable determination of the few-layer graphene oxide thickness using Raman spectroscopy
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P. Šiffalovič | E. Majková | M. Hulman | M. Jergel | M. Omastová | Zdenko Špitálský | Y. Halahovets | M. Bodík | D. Kostiuk | Michal Pelach | M. Hodas | M. Pelletta