An automated multiport measurement system for linear and non-linear characterization of N-port microwave devices

A measurement system based on microwave transition analyzer (MTA) as a receiver is proposed for time domain and frequency domain characterization of linear and non-linear N-port microwave devices. The proposed measurement system is able to perform full S-parameters characterization for N-port devices with only one measurement connection step. The system is also sensitive to the input power variation without the need of recalibration at each input power level.