On-line testing field programmable analog array circuits

This work presents an efficient methodology to on-line test field programmable analog array (FPAA) circuits. It proposes to partition the FPAA circuit under test into sub circuits. Each sub circuit is tested by replicating the sub circuit with programmable resources on FPAAs, and comparing the outputs of the original partitioned sub circuit and its replication. The advantages of this approach includes: low implementation cost, enhanced testability, and flexible testing schedules. This work also presents circuit techniques to address stability problems which are often encountered in the proposed on-line testing approach. In addition, the impact of performing circuit partition on testability is investigated in this work. It shows that testability is generally improved in partitioned circuits. Finally, experimental results are presented to demonstrate the feasibility and effectiveness of the proposed techniques.

[1]  D. Vazquez,et al.  Testable Switched-Capacitor Filters , 1992, ESSCIRC '92: Eighteenth European Solid-State Circuits conference.

[2]  Salvador Mir,et al.  Analog checkers with absolute and relative tolerances , 1995, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[3]  Abhijit Chatterjee,et al.  Optimal design of checksum-based checkers for fault detection in linear analog circuits , 1997, Proceedings Tenth International Conference on VLSI Design.

[4]  Sondes Sahil,et al.  Test generation and concurrent error detection in current-mode a/d converters , 1992 .

[5]  Luigi Carro,et al.  A new adaptive analog test and diagnosis system , 2000, IEEE Trans. Instrum. Meas..

[6]  C. Stroud,et al.  Fault injection emulation for field programmable analog arrays , 2003, Southwest Symposium on Mixed-Signal Design, 2003..

[7]  Dean R. D'Mello,et al.  Design Approaches to Field-Programmable Analog Integrated Circuits , 1998 .

[8]  Abhijit Chatterjee,et al.  Checksum-based concurrent error detection in linear analog systems with second and higher order stages , 1992, Digest of Papers. 1992 IEEE VLSI Test Symposium.

[9]  Michael Nicolaidis,et al.  On-line BIST for testing analog circuits , 1999, Proceedings 1999 IEEE International Conference on Computer Design: VLSI in Computers and Processors (Cat. No.99CB37040).

[10]  Osama K. Abu-Shahla,et al.  An on-line self-testing switched-current integrator , 1997, Proceedings International Test Conference 1997.

[11]  M. Mar,et al.  An architecture for a configurable mixed-signal device , 2003 .

[12]  Marek Wojcikowski,et al.  A field programmable analog array for CMOS continuous-time OTA-C filter applications , 2002 .

[13]  Salvador Mir,et al.  Design of self-checking fully differential circuits and boards , 2000, IEEE Trans. Very Large Scale Integr. Syst..

[14]  Ian Macbeth,et al.  DPAD2—A Field Programmable Analog Array , 1998 .

[15]  Yiorgos Makris,et al.  An analog checker with dynamically adjustable error threshold for fully differential circuits , 2003, Proceedings. 21st VLSI Test Symposium, 2003..

[16]  Sundaram Natarajan.  Theory and Design of Linear Active Networks , 1987 .

[17]  D. Vazquez,et al.  A high-Q bandpass fully differential SC filter with enhanced testability , 1997, Proceedings of the 23rd European Solid-State Circuits Conference.

[18]  Diego Vázquez,et al.  A solution for the on-line test of analog ladder filters , 1995, Proceedings 13th IEEE VLSI Test Symposium.

[19]  Antonio Andrade,et al.  An approach to the built-in self-test of field programmable analog arrays , 2004, 22nd IEEE VLSI Test Symposium, 2004. Proceedings..

[20]  Vu Duong,et al.  Experimental results in evolutionary fault-recovery for field programmable analog devices , 2003, NASA/DoD Conference on Evolvable Hardware, 2003. Proceedings..

[21]  Chin-Long Wey,et al.  Test generation and concurrent error detection in current-mode A/D converters , 1995, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[22]  Luigi Carro,et al.  A statistical sampler for a new on-line analog test method , 2002, Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002).

[23]  Jaime Velasco-Medina,et al.  An approach to the on-line testing of operational amplifiers , 1998, Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259).

[24]  Joan Figueras,et al.  Testing Biquad Filters under Parametric Shifts Using X-Y Zoning , 2005, J. Electron. Test..