Electron beam lithography: resolution limits and applications
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Christophe Vieu | Franck Carcenac | L. Couraud | C. Vieu | Yong Chen | H. Launois | F. Carcenac | A. Pépin | M. Mejías | A. Lebib | L. Manin-Ferlazzo | L. Couraud | Yong Chen | Huguette Launois | A. Lebib | A. Pépin | L. Manin-Ferlazzo | M. Mejias
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