Defect Oriented Testing for Analog/Mixed-Signal Designs

In this contribution, the authors describe an application of Defect Oriented Testing (DOT) to commercial mixed-signal designs. A major challenge of DOT application to these designs is the enormous simulation time typically required. The authors address this major challenge with a new algorithm that provides a significant speed-up of over 100x, while at the same time reduces test time by 48% and improves fault coverage by 15%.

[1]  Nur Engin,et al.  Practical implementation of defect-oriented testing for a mixed-signal class-D amplifier , 1999, European Test Workshop 1999 (Cat. No.PR00390).

[2]  Thomas Olbrich,et al.  Defect-oriented vs schematic-level based fault simulation for mixed-signal ICs , 1996, Proceedings International Test Conference 1996. Test and Design Validity.

[3]  João Paulo Teixeira,et al.  Automatic fault extraction and simulation of layout realistic faults for integrated analogue circuits , 1995, Proceedings the European Design and Test Conference. ED&TC 1995.

[4]  Salvador Mir,et al.  CAT platform for analogue and mixed-signal test evaluation and optimization , 2006, VLSI-SoC.

[5]  John Paul Shen,et al.  Inductive Fault Analysis of MOS Integrated Circuits , 1985, IEEE Design & Test of Computers.

[6]  Joonsung Parky,et al.  Defect-based analog fault coverage analysis using mixed-mode fault simulation , 2009, 2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop.

[7]  Yang Zhong,et al.  Implementation of Defect Oriented Testing and ICCQ testing for industrial mixed-signal IC , 2007, 16th Asian Test Symposium (ATS 2007).

[8]  Camelia Hora,et al.  Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example , 2011, 2011 Design, Automation & Test in Europe.

[9]  Sule Ozev,et al.  Defect-Oriented Testing of RF Circuits , 2008, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[10]  Camelia Hora,et al.  Defect Oriented Testing for analog/mixed-signal devices , 2011, 2011 IEEE International Test Conference.

[11]  Frank Poehl,et al.  Production test challenges for highly integrated mobile phone SOCs — A case study , 2010, 2010 15th IEEE European Test Symposium.