Exploration of the ultimate patterning potential achievable with focused ion beams.
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Jacques Gierak | Eric Bourhis | L. Bruchhaus | Giancarlo Faini | Gilles Patriarche | Ali Madouri | Ralf Jede | S. Bauerdick | B. Schiedt | A. L. Biance | Loïc Auvray | J. Giérak | E. Bourhis | A. Madouri | B. Schiedt | G. Faini | G. Patriarche | L. Auvray | S. Bauerdick | A. Biance | R. Jede | L. Bruchhaus | E. Bourhis
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