High resolution depth profiling in near-surface regions of solids by narrow nuclear reaction resonances below 0.5 MeV with low energy spread proton beams

[1]  J. Ziegler.  The stopping and range of ions in solids vol 1 : The stopping and ranges of ions in matter , 2013 .

[2]  R. Doremus,et al.  Silica Films on Silicon Thickness Measurement by Electron Microscopy and Ellipsometry , 1994 .

[3]  G. Mitchell,et al.  Novel applications of high-energy resolution ion beams , 1992 .

[4]  M. Balkanski,et al.  Use of RBS and Raman spectroscopy to study oxygen mobility in YBaCuO thin films by 18O tracing experiments , 1992 .

[5]  I. Trimaille,et al.  NRA and XPS characterizations of layers formed by rapid thermal nitridation of thin SiO2 films , 1992 .

[6]  I. Vickridge,et al.  A very narrow resonance in 18O(p, α)15N near 150 keV: Application to isotopic tracing: I. Resonance width measurement☆ , 1991 .

[7]  P. Endt,et al.  Energy levels of A = 21−44 nuclei (V) , 1990 .

[8]  I. Trimaille,et al.  Use of 18O isotopic labelling to study thermal dry oxidation of silicon as a function of temperature and pressure , 1989 .

[9]  G. Mitchell,et al.  Improvements in targetry and high voltage stability for high resolution ion beam experiments , 1989 .

[10]  J. A. Cilliers,et al.  The energy levels of 30P , 1985 .

[11]  B. Agius,et al.  An 18O Study of the Oxidation Mechanism of Silicon in Dry Oxygen , 1984 .

[12]  G. Amsel,et al.  High resolution techniques for nuclear reaction narrow resonance width measurements and for shallow depth profiling , 1983 .

[13]  G. Amsel,et al.  Depth profiling with narrow resonances of nuclear reactions: Theory and experimental use , 1982 .

[14]  K. P. Jackson,et al.  Nuclear and astrophysical aspects of 18O(p, γ)19F , 1980 .

[15]  E. Rosencher,et al.  An 18O study of the thermal oxidation of silicon in oxygen , 1979 .

[16]  H. Lorenz-Wirzba.  The 18O(p, a)15N reaction at stellar energies , 1979 .