1/f noise in advanced CMOS transistors

This paper is a review of 1/f noise in state-of-the-art advanced MOSFETs, where the channel length has deep submicron or nano-scale dimensions. The origin of 1/f noise, models of 1/f noise, and ways of measuring 1/f noise are briefly reviewed.

[1]  Yong-Zhong Xiong,et al.  Test Structure for Characterization of Low-Frequency Noise in CMOS Technologies , 2010, IEEE Transactions on Instrumentation and Measurement.

[2]  Yong-bin Kim,et al.  Challenges for Nanoscale MOSFETs and Emerging Nanoelectronics , 2010 .

[3]  A. Dasgupta,et al.  Effects of Total Dose Irradiation on the Gate-Voltage Dependence of the $\hbox{1}/f$ Noise of nMOS and pMOS Transistors , 2010, IEEE Transactions on Electron Devices.

[4]  J. Sikula,et al.  Amplitude of RTS noise in MOSFETs , 2009, 2009 International Conference on Microelectronics - ICM.

[5]  Y. Nemirovsky,et al.  CMOS-SOI-MEMS Transistor for Uncooled IR Imaging , 2009, IEEE Transactions on Electron Devices.

[6]  L.K.J. Vandamme,et al.  What Do We Certainly Know About $\hbox{1}/f$ Noise in MOSTs? , 2008, IEEE Transactions on Electron Devices.

[7]  I. Brouk,et al.  Analysis of noise in CMOS image sensor , 2008, 2008 IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems.

[8]  R.P. Jindal,et al.  Compact Noise Models for MOSFETs , 2006, IEEE Transactions on Electron Devices.

[9]  Yael Nemirovsky,et al.  Noise characterization of the 0.35 /spl mu/m CMOS analog process implemented in regular and SOI wafers , 2004, Proceedings of the 2004 11th IEEE International Conference on Electronics, Circuits and Systems, 2004. ICECS 2004..

[10]  J. Jomaah,et al.  Low-frequency noise in advanced CMOS/SOI devices , 2004 .

[11]  Gerard Ghibaudo,et al.  Low-frequency noise and fluctuations in advanced CMOS devices , 2003, SPIE International Symposium on Fluctuations and Noise.

[12]  M. Marin,et al.  Impact of scaling down on 1/f noise in MOSFETs , 2003, SPIE International Symposium on Fluctuations and Noise.

[13]  Gérard Ghibaudo,et al.  Electrical noise and RTS fluctuations in advanced CMOS devices , 2002, Microelectron. Reliab..

[14]  William Liu,et al.  MOSFET Models for SPICE Simulation: Including BSIM3v3 and BSIM4 , 2001 .

[15]  A.J. Scholten,et al.  Impact of process scaling on 1/f noise in advanced CMOS technologies , 2000, International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).

[16]  E. P. Vandamme,et al.  Critical discussion on unified 1/f noise models for MOSFETs , 2000 .

[17]  Chun-Yu Chen,et al.  Design and calibration of a noise measurement system , 2000, IEEE Trans. Instrum. Meas..

[18]  E. Klumperink,et al.  Reducing MOSFET 1/f noise and power consumption by switched biasing , 1999, IEEE Journal of Solid-State Circuits.

[19]  Yuan Taur,et al.  Fundamentals of Modern VLSI Devices , 1998 .

[20]  Yael Nemirovsky,et al.  1/f Noise in CMOS transistors for analog applications from subthreshold to saturation , 1998 .

[21]  Amikam Nemirovsky,et al.  A revised model for carrier trapping-detrapping noise , 1997 .

[22]  Y. Nemirovsky,et al.  1/f noise in CMOS transistors for analog applications , 1996, Proceedings of 19th Convention of Electrical and Electronics Engineers in Israel.

[23]  Eddy Simoen,et al.  Explaining the amplitude of RTS noise in submicrometer MOSFETs , 1992 .

[24]  Roberto Saletti,et al.  Low-noise automated measurement system for low-frequency current fluctuations in thin-oxide silicon structures , 1991, [1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference.

[25]  Max J. Schulz,et al.  Individual, attractive defect centers in the SiO2-Si interface of μm-sized MOSFETs , 1991 .

[26]  Michael J. Uren,et al.  1/f and random telegraph noise in silicon metal‐oxide‐semiconductor field‐effect transistors , 1985 .

[27]  R. Howard,et al.  Discrete Resistance Switching in Submicrometer Silicon Inversion Layers: Individual Interface Traps and Low-Frequency ( 1 f ?) Noise , 1984 .

[28]  Eddy Simoen,et al.  Low-frequency noise in silicon-on-insulator devices and technologies , 2007 .