论文信息 - EPR, XRD and optical reflectivity studies of radiation damage in silicon after high energy implantation of Ni ions - 字舞流文

EPR, XRD and optical reflectivity studies of radiation damage in silicon after high energy implantation of Ni ions

A. R. Chelyadinskii | J. Lindner | A. Zaitsev | V. Varichenko | D. P. Erchak | N. M. Penina | R. Domres | V. A. Martinovitsh