Materials Characterization Using Reconstructed Thermographic Data

Pulsed thermography has generally been used to identify, and in some cases, measure the depth of subsurface defects. In general, quantitative analysis of pulsed thermographic data has required the presence of a reference sample or region in the field of view, which is not practical for a majority of real inspection situations. Recently, we have developed a new approach to processing pulsed thermographic data, Thermographic Signal Reconstruction (TSR), which allows quantitative characterization without the use of a reference region.