SET: interactive tool for learning and training scan-based DFT principles and their consequences to parameters of embedded system

In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to illustrate relation between design and diagnostic parameters of embedded system

[1]  Zdenek Kotásek,et al.  Testability improvements based on the combination of analytical and evolutionary approaches at RT level , 2002, Proceedings Euromicro Symposium on Digital System Design. Architectures, Methods and Tools.

[2]  Zdenek Kotásek,et al.  Educational tool for the demonstration of DfT principles based on scan methodologies , 2005, 8th Euromicro Conference on Digital System Design (DSD'05).

[3]  Josef Strnadel Scan Layout Encoding by Means of a Binary String , 2003 .