BOUNDARY SCAN WITH CELLULAR-BASED BUILT-IN SELF-TEST
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[1] Paul H. Bardell,et al. Self-Testing of Multichip Logic Modules , 1982, International Test Conference.
[2] Donald Komonytsky,et al. LSI Self-Test Using Level Sensitive Scan Design and Signature Analysis , 1982, ITC.
[3] Jacob Savir,et al. Built In Test for VLSI: Pseudorandom Techniques , 1987 .
[4] Johnny J. LeBlanc,et al. LOCST: A Built-In Self-Test Technique , 1984, IEEE Design & Test of Computers.
[5] Peter Dirk Hortensius. Parallel computation of non-deterministic algorithms in vlsi , 1987 .