Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes
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A. Bosio | P. Girard | S. Pravossoudovitch | A. Virazel | L. Dilillo | N. Badereddine | Renan Alves Fonseca
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A. Bosio | P. Girard | S. Pravossoudovitch | A. Virazel | L. Dilillo | N. Badereddine | Renan Alves Fonseca