CDF run IIb silicon: design and testing
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T. Akimoto | S. Behari | D. Benjamin | D. Bisello | G. Bolla | G. Busetto | S. Cabrera | A. Canepa | M. Chertok | C. Ciobanu | J. Galyardt | G. Giurgiu | C. Haber | C. Hill | J. Incandela | E. Jeon | T. Junk | D. Kong | R. Lander | R. Lu | P. Lujan | P. Lukens | P. Maksimovic | P. Merkel | I. Nakano | T. Okusawa | R. Orava | K. Osterberg | D. Pellett | J. Pursley | A. Soha | J. Hoff | B. Flaugher | B. Nord | W. Wester | R. Lauhakangas | K. Yamamoto | E. Feng | M. Garcia-Sciveres | T. Nelson | R. Tanaka | M. Aoki | M. Tavi | M. Kruse | P. Azzi | N. Bacchetta | D. Stuart | J. Yun | R. Harr | K. Joo | J. Lee | W. Yao | D. Bortoletto | K. Hara | V. Pavlicek | N. Kuznetsova | J. Freeman | A. Shenai | R. Yarema | T. Zimmerman | E. Mandelli | F. Zetti | J. Walder | B. Krieger | Y. Yang | M. Weber | D. Pantano | B. Holbrook | D. Hale | S. Kyre | S. Moccia | G. Derylo | K. Kobayashi | S. Zucchelli | M. Hrycyk | Y. Orlov | J. Fernandez | S. Zimmermann | I. Fang | C. Manea | G. Cardoso | S.C. Hong | S. Kim | H. von der Lippe | L. Galtieri | T. Hsiung | H. Kahkola | S. Karjalainen | T. Landry | S. Min | J. Novak | P. Riipinen | B. Schuyler | Z. Wang | Y.C. Yang
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